Tuesday June 12th, 2012

10:00-10:15 Welcome Address
Anton Grabmaier, Fraunhofer IMS

2D - Imaging
10:15-11:00 Worse Imagers – Better Images
Albert Theuwissen, Harvest Imaging

11:00-11:45 Optimizing the Heart of Modern CIS Pixels: The Pinned Diode and Beyond
Amos Fenigstein, TowerJazz

11:45-12:30 CMOS Imagers for Professional Applications
Rainer Schweer, Viimagic
Peter Centen, Grass Valley

12:30-13:30 Lunch

13:30-14:15 Space Imaging
Dirk Viehmann, Astrium

3D - Time - of - FlightImaging
14:15-15:00 3D-ToF Imaging with PMD Sensors - Application Requirements and Solutions
Robert Lange, PMD Technologies

15:00-15:30 Break

15:30-16:15 CA PDs and 3D-ToF Imaging
Daniel van Nieuwenhove, SoftKinetic

16:15-17:00 CMOS Sensors for ToF Ranging
Werner Brockherde, Fraunhofer IMS

as of 17:00 Evening Event

Wednesday June 13th, 2012

Nonvisible - Imaging
9:00-9:45 Thermal Imagers Based on Uncooled Microbolometers
Holger Vogt, Fraunhofer IMS

9:45-10:30 Medical X-Ray Imaging Using Wafer-Scale CMOS Image Sensors
Jan Bosiers, Teledyne DALSA

10:30-11:00 Break

Optics & Cameratesting
11:00-11:45 Optics for CMOS Imagers
Ziv Attar, OpEra Optics

11:45-12:30 Camera Characterisation Based on EMVA 1288
Bernd Jähne, University of Heidelberg

12:30-13:30 Lunch

SPAD- Imagi g
13:30-14:15 Scaleable SPAD Structures for High Resolution Single Photon Image Sensors
Robert Henderson, University of Edinburgh

14:15-15:00 Fully Integrated Arrays of DIGITAL Si-Photomultipliers
York Hämisch, Philips

15:00-15:45 SPAD-Technology and Applications
Franco Zappa, Politecnico di Milano

as of 16:00 Visit of wafer fab and inHaus-Zentrum
(subject to space availability)

Workshop Fee 550 € (Registration before April 15th, 2012)700 € (Registration before May 15th, 2012)The workshop fee includes a USB memory stick with all presentations, lunches, and the evening event on June 12th, 2012. Cancellations Half of the payment will be reimbursed for cancellationsreceived before May 15th, 2012. Later cancellations will not bereimbursed! Terms of Payment After reception of the registration form, an invoice will be sent to the participants and the fee has to be transferred under referenceof the invoice number until May 15th, 2012, at the latest Payment by credit card is not possible.
Contact at Fraunhofer IMS:
Cornelia Metz
Phone +49 203 / 3783-210
Fax +49 203 / 3783-278
cornelia.metz(at)ims.fraunhofer.de
www.ims.fraunhofer.de

6th Fraunhofer IMS Workshop CMOS Imaging on 2012-06-12 at FHG IMS in Duisburg Germany.

Sensor systems and platforms

Sensor and data analysis

New for 2012

The International Workshop on Radiation Imaging Detectors is a series of conferences, held yearly, which started in Sundsvall, Sweden in 1999 and continued in Freiburg, Germany, Orosei, Italy, Amsterdam, The Netherlands, Riga, Latvia, Glasgow, UK, Grenoble, France, Pisa, Italy, Erlangen, Germany, Helsinki, Finland, Prague, Czech Republic, Cambridge, UK, and the last one in Zürich, Switzerland.

In 2012, the International Workshop on Radiation Imaging Detectors will take place from 1 to 5 of July in the sunny "Silver Coast" region of Portugal, in the resort Figueira da Foz, elected the "Queen of the Beaches", due to its 15 km of sandy beach. Figueira da Foz is just 40 km away from Coimbra, a historical city that hosts one of the oldest universities of Europe (1290), together with Bologna and Santiago de Compostela, more than 700 years old.

This workshop provides an international forum for discussing current research and development in the area of position sensitive detectors for radiation imaging, including semiconductor detectors, gas- and scintillator-based detectors and applications.

The iWoRID2012 conference will be held in the "CAE-Centro de Artes e Espectáculos da Figueira da Foz", a modern Conference Hall with pleasant, ample space, including an inner garden with glazed roof (CAE).

The complete address is Rua Abade Pedro, 3080-084 Figueira da Foz, Portugal.

As in previous meetings, the main topics will be:

1. Detector Systems (includes the wide assortment of detector systems ranging from large LHC detectors to small single-diode systems, from visible light to heavy charged particles);
2. Sensor Materials, Device Processing & Technologies (Sensor material and technologies, such as Silicon (single crystal and amorphous), Gallium Arsenide, Cadmium Telluride and other semiconductors, 3D and edgeless sensors, Processing, Characterization, Reliability, Radiation damage, Scintillators);
3. Front-end Electronics and Readout (dedicated to ASICS, include MAPS, CMOS and SiOI , Monolithic and hybrid systems, Single photon counting and charge integrating front ends, 3D asics, Monolithic active pixel sensors, CCDs, Data readout architectures, Hardware and software, Data compression, transfer and storage);
4. Imaging theory (Integrating vs counting mode, Energy weighting, Correction algorithms);
5. High Energy Physics & Astronomy (Detectors and applications probing the standard model, like Tracking detectors, Vertex detectors, Particle detectors, Low- and High-energy Photon detection);
6. Free Electron Lasers (Detector development dealing with high photon fluxes and its applications, Charge integrating, DEPFET);
7. Applications (range from astronomy, nuclear to medical applications, Material Analysis, X-ray diffraction and fluorescence, Protein crystallography, Tomography, high resolution and fast imaging, Biological and medical imaging, Electron microscopy, Security systems and other industrial applications, Applications at X-ray free electron lasers, Neutron imaging, Astronomical and space applications, High energy physics, Nuclear physics, Fusion research);

The program will consist of invited lectures, oral presentations and a poster session.

Scientists, engineers and exhibitors are invited to join the workshop and share not only work and results but also their valuable experience, contributing to the enrichment of the international community.

Pixel 2012 6th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging 3–7 September  2012 in Inawashiro, Japan

The workshop will cover various topics related to pixel detector technology. Development and applications will be discussed for charged particle tracking in High Energy Physics, Nuclear Physics, Astrophysics, and X-ray imaging in Astronomy, Biology, Medicine and Material Science. The conference program will also include reports on front and back end electronics, radiation effects, low mass mechanics and construction techniques, and new technologies such as monolithic and 3D integrated detectors. 

SPIE Security + Defence

SPIE Remote Sensing

IEEE SENSORS 2012 is intended to provide a forum for research scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, and applications in the area of sensors and sensing technology. IEEE SENSORS 2012 will include keynote addresses and invited presentations by eminent scientists. The Conference solicits original state-of-the-art contributions as well as review papers.

- Radiation Damage in Semiconductor Detectors -

A personal selection of conferences, workshops and meetings dealing with HEP semiconductor detectors and/or radiation damage in semiconductors.

Im Cern